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25 | 05 | 2013
 
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Test & Burn-In Socket and Adapter Solutions
TEST AND BURN-IN SOLUTIONS
Aries Test and Burn-In Yamaichi

ARIES | Test- and Burn-In Product News Flash
ARIES Machines High Frequency Center Probe Test Socket

Machined High-Frequency Center Probe Test Sockets Now Available in Pitch Sizes Down to 0.30 mm - ARIES

Ideal for wide variety of BGA, CSP and MLF packages

Aries Electronics, manufacturer of standard, programmed and custom interconnection products, now offers machined high-frequency center probe test sockets to accommodate IC devices with a lead pitch of 0.30 mm. With very low inductance and capacitance, the sockets are ideal for a wide variety of BGA (ball grid array), CSP (chip scale package) and MLF (micro land frame) packages.

Machined High Frequency Center Probe Test Sockets (PDF Download)
■ ARIES Datasheet - DEMA Part ID: 24010

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