Home Linecard Aries BGA, µBGA, LGA, QFN, QFP, MLF, LCC & CSP Sockets and Adapters - ARIES
19 | 05 | 2012
 
DEMA Electronic AG
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DEMA Electronic AG
Test- and Burn-In Product News Flash
ARIES Machines High Frequency Center Probe Test Socket
Aries’ Machined High-Frequency Center Probe Test Sockets Now Available in Pitch Sizes Down to 0.30 mm

Ideal for wide variety of BGA, CSP and MLF packages

Aries Electronics, manufacturer of standard, programmed and custom interconnection products, now offers machined high-frequency center probe test sockets to accommodate IC devices with a lead pitch of 0.30 mm. With very low inductance and capacitance, the sockets are ideal for a wide variety of BGA (ball grid array), CSP (chip scale package) and MLF (micro land frame) packages.

Lesen Sie das komplette PRESS RELEASE:
Machined High Frequency Center Probe Test Sockets 16 KB

Weiterführende Informationen finden Sie auf:
DEMA Part ID: 24010 – Datasheet Link: http://www.dema.net/pdf/htm/9595

DEMA Electronic AG