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19 | 05 | 2012
 
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DEMA Electronic AG
Aries Electronics - Test and Burn-In

Your Best Source for Interconnection & Packaging Solutions!

Aries Electronics is a leading manufacturer of a broad range of interconnect products and Correct-A-Chip™
technology with of variety of interconnect products for Test and Burn-in applications including...

  • ZIF (Zero-Insertion-Force) Test Sockets for DIP, PGA, PLCC, and SOIC Devices
  • Correct-A-Chip™ Product Line of “Intelligent Connectors” – for Passive and Active Components
  • Adapters – Connectors Using One Termination Style on Boards Designed for Different Styles
  • BGA (Ball Grid Array) and LGA (Land Grid Array) Sockets
  • High-Frequency (RF) Test and Burn-in Sockets


Test and Burn-In Products from Aries:

Link to

- Aries Electronics

Product News

- New Kelvin Test Socket
- New Fine Pitch Bump Adapters
- Socket 23017 Adjustable Preasure Pad
- Switch a Pitch Adapter

PDF Download

- Product Selection Webguide
- Test and Burn-In Overview
- CSP Test Socket Explanation
- FAQ: BGA and CSP Socket Explanation
1 Correct-A-Chip™ Adapters - ARIES
2 BGA, µBGA, LGA, QFN, QFP, MLF, LCC & CSP Sockets and Adapters - ARIES
3 Zero-Insertion-Force (ZIF) Test Sockets - ARIES
4 High-Frequency (RF) Test Sockets - ARIES
5 LED / LCD Display Sockets - ARIES
6 DIP / SIP Sockets and Headers - ARIES
7 PGA & other Sockets - ARIES
8 Programming Devices - ARIES
9 Tools & Accessories - ARIES

Test- and Burn-In Product News Flash
Hi-Temp 200 °C Test and Burn-in Socket
Hi-Temp 200°C Test & Burn-in Sockets for BGA, LGA, QFN, MLCC and Bumped Die Devices von Aries
Enables Testing of Any Area-array Device to +200°C High-temp Sockets useful in Military, Aerospace and Geophysical Applications

Aries Electronics, a US manufacturer of standard, programmed and custom interconnection products used worldwide, now offers the industry's first CSP sockets that accept any area-array device for high-temperature testing up to +200°C. The new AR4HT Series sockets incorporate a low-profile 0.45 mm contact structure (compressed) that is shorter than other low-profile contacts and provides excellent compliance for reliable ATE testing and burn-in.

Lesen Sie das komplette PRESS RELEASE:
Hi-Temp 200°C Test & Burn-in Sockets 39 KB

Weiterführende Informationen finden Sie auf: http://www.dema.net/aries/

DEMA Electronic AG